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Xuguang Shen
Xuguang Shen
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Reliability engineering
Scalability
Logic gate
Electronic design automation
Static timing analysis
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Aging-Aware Gate-Level Modeling for Circuit Reliability Analysis
2021
IEEE Transactions on Electron Devices
Zuodong Zhang
Runsheng Wang
Xuguang Shen
Dehuang Wu
Jiayang Zhang
Zhe Zhang
Joddy Wang
Ru Huang
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