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Fred Gaillard
Fred Gaillard
Optoelectronics
Materials science
Reliability engineering
Computer science
Scaling
3
Papers
8
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Low temperature high voltage analog devices in a 3D sequential integration
2020
VLSI-TSA | International Symposium on VLSI Technology, Systems, and Applications
C. Cavalcante
X. Garros
Perrine Batude
A. Tataridou
J. Lacord
Mikael Casse
C. Theodorou
T. Karatsori
R. Gassilloud
C. Fenouillet-Beranger
L. Brunet
O. Rozeau
N. Rambal
Fred Gaillard
F. Ponthenier
F. Allain
G. Romano
Gérard Ghibaudo
J.-P. Colinge
Maud Vinet
François Andrieu
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Citations (3)
Performance and Low-Frequency Noise of 22-nm FDSOI Down to 4.2 K for Cryogenic Applications
2020
IEEE Transactions on Electron Devices
Bruna Cardoso Paz
Mikael Casse
Christoforos G. Theodorou
G. Ghibaudo
Thorsten Kammler
L. Pirro
Maud Vinet
Silvano De Franceschi
Tristan Meunier
Fred Gaillard
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Citations (4)
(Invited) Reliability and Scaling Perspectives of HfO2-Based OxRAM
2020
Carlo Cagli
Jury Sandrini
Gilbert Sassine
Diego Alfaro Robayo
Ismail Hammad
Gabriel Molas
Fred Gaillard
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Citations (1)
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