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A. Benoist
A. Benoist
University of Lyon
Electronic engineering
CMOS
Engineering
Non-volatile memory
Limiting factor
2
Papers
34
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Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology
2015
IRPS | International Reliability Physics Symposium
A. Benoist
S. Denorme
X. Federspiel
Bruno Allard
Philippe Candelier
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Citations (1)
28nm advanced CMOS resistive RAM solution as embedded non-volatile memory
2014
IRPS | International Reliability Physics Symposium
A. Benoist
S. Blonkowski
Simon Jeannot
S. Denorme
Joel Damiens
J Berger
Philippe Candelier
Elisa Vianello
H. Grampeix
J. F. Nodin
E. Jalaguier
L. Perniola
B. Allard
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Citations (33)
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