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Huazheng Wei

5

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12

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Investigation of Threshold Voltage Distribution Temperature Dependence in 3D NAND Flash

2019 IEEE Electron Device Letters
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Cycling Induced Trap Generation and Recovery Near the Top Select Gate Transistor in 3D NAND.

2019 IRPS | International Reliability Physics Symposium
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Investigation of Erase Cycling Induced TSG Vt Shift in 3D NAND Flash Memory

2019 IEEE Electron Device Letters
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Cycling Induced Trap Generation and Recovery Near the Top Select Gate Transistor in 3D NAND.

2019 IRPS | International Reliability Physics Symposium
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