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David Lepejian
David Lepejian
Computer science
Computer engineering
Bitmap
embedded memory
Embedded system
4
Papers
43
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Using electrical bitmap results from embedded memory to enhance yield
2001
IEEE Design & Test of Computers
Julie Segal
Alvin Jee
David Lepejian
Ben Chu
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Citations (38)
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield
2001
IEEE Computer Architecture Letters
Julie Segal
A. Jee
David Lepejian
Ben Chu
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Design practices for better reliability and yield (tutorial)
2000
DATE | Design, Automation, and Test in Europe
Yervant Zorian
Michael Nicolaidis
Peter Muhmenthaler
David Lepejian
Chris W. H. Strolenberg
Kees Veelenturf
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A D&T Roundtable: Testing Mixed Logic and DRAM Chips
1998
IEEE Design & Test of Computers
Meh-Ron Amerian
William D. Atwell Jr.
Ian Burgess
Gary D. Fleeman
David Lepejian
T. w. Williams
Farzad Zarrinfar
Yervant Zorian
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Citations (5)
1