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J. Y. #Name
J. Y. #Name
Oxide
Analytical chemistry
Irradiation
X-ray
Communication channel
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Effects of X-Ray Irradiation on the Channel Hot-Carrier Reliability of Thin-Oxide n-Channel MOSFETs
1986
The Japan Society of Applied Physics
J. Y. #Name
J. R. Maldonado
M.D Rodriguez
J. Laskar
D. S. Zicherman
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