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K.Y. Doong
K.Y. Doong
Physical design
Electronic engineering
Integrated circuit design
Electrical measurements
Circuit design
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Optimization of 2.14 um/sup 2/ 6T-SRAM cell by using cell-like test structures
2004
ICMTS | International Conference on Microelectronic Test Structures
S. Hsieh
R.f. Tsui
W Lin
J.J. Liaw
K.Y. Doong
C.-M.M. Wu
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