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Tian Caijuan
Tian Caijuan
Sichuan University
Thin film
Transmittance
Refractive index
X-ray crystallography
X-ray photoelectron spectroscopy
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Structural and optical properties of Cd0.8Zn0.2S thin films
2011
Journal of Semiconductors
Di Xia
Tian Caijuan
Tang Rongzhe
Li Wei
Feng Lianghuan
Zhang Jingquan
Wu Lili
Lei Zhi
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Citations (14)
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