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Jérôme Adrian

STMicroelectronics

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Picosecond laser micromachining prior to FIB milling for electronic microscopy sample preparation

2017 Applied Surface Science
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Optimization of picosecond laser processing for microscopy sample preparation prior to Ion milling polishing

2017 EQEC | European Quantum Electronics Conference
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Thermographie hétérodynée et thermoréflectance ponctuelle à haute résolution temporelle pour le diagnostic thermique de composants microélectroniques

2017
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