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S. S. Laderman

Hewlett-Packard

62

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State-of-the-Art Evaluation of Ultra-Clean Ulsi Processes

1997 MRS Proceedings
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X-ray Background Signals in Total Reflection X-ray Fluorescence Spectroscopy

1996
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X-ray Background Signals in Total Reflection X-ray Fluorescence Spectroscopy

1996
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Total reflection x-ray fluorescence spectroscopy using synchrotron radiation for wafer surface trace impurity analysis (invited)

1995 Review of Scientific Instruments
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High-Sensitivity Total Reflection X-Ray Fluorescence Spectroscopy of Silicon Wafers Using Synchrotron Radiation.

1995 Analytical Sciences
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Wide band-pass approaches to total-reflection X-ray fluorescence using synchrotron radiation

1994 Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
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Surface resistance of epitaxial YBa2Cu3O7 thin films on CeO2 diffusion barriers on sapphire

1992 Applied Physics Letters
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RESISTIVE LOSS AT 10 GHZ IN C-AXIC-ALIGNED IN-SITU-GROWN YBA2CU3O7 FILMS

1991 Physical Review B
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A-Axis--Oriented YBa2Cu3O7/PrBa2Cu3O7 Superlattices.

1991 Science
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Synthesis and properties of YBa2Cu3O7 thin films grown in situ by 90° off-axis single magnetron sputtering

1990 Physica C-superconductivity and Its Applications
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Citations (213)