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Ho-Se Lee
Ho-Se Lee
Metrology
Atomic force microscopy
Nanotechnology
Cantilever
Throughput
2
Papers
1
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Parallel active cantilever AFM tool for high-throughput inspection and metrology
2019
Mathias Holz
Christoph Reuter
Ahmad Ahmad
Alexander Reum
Tzvetan Ivanov
Elshad Guliyev
Ivo W. Rangelow
Ho-Se Lee
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LBS/GPS based Bicycle Safety Application with Arduino
2016
IOT | The Internet of Things
Dong-Gun Kim
Ho-Se Lee
So Young Kim
Tae-Woo Kim
Hyung-Woo Lee
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