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N. Vivet
N. Vivet
STMicroelectronics
Sintering
Porosity
Scanning electron microscope
Microstructure
Focused ion beam
7
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35
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Quantitative Analysis of Porosity and Transport Properties by FIB-SEM 3D Imaging of a Solder Based Sintered Silver for a New Microelectronic Component
2016
Journal of Electronic Materials
Wafaa Rmili
N. Vivet
S. Chupin
T. Le Bihan
G. Le Quilliec
Caroline Richard
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Citations (13)
Power modules die attach: A comprehensive evolution of the nanosilver sintering physical properties versus its porosity
2015
Microelectronics Reliability
Toni Youssef
Wafaa Rmili
Eric Woirgard
Stephane Azzopardi
N. Vivet
Donatien Martineau
Régis Meuret
G. Le Quilliec
Caroline Richard
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Citations (20)
Quantification 2D et 3D par tomographie FIB/SEM de la porosité d’une brasure à base d’argent fritté pour un nouveau composant microélectronique
2015
Wafaa Rmili
N. Vivet
Sylvain Chupin
Tristan Le Bihan
Guenhael Le Quilliec
Caroline Richard
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Citations (1)
Reliability in Power Modules Die Attach: A Comprehensive Evolution of the Nanocrystalline Silver Sintering Physical Properties Versus its Porosity
2015
Microelectronics Reliability
Toni Youssef
Wafaa Rmili
Eric Woirgard
Stephane Azzopardi
N. Vivet
Donatien Martineau
Régis Meuret
Guenhael Le Quilliec
Caroline Richard
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