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J. Liu
J. Liu
University of Delaware
Intermetallic
Metallurgy
Thin film
Annealing (metallurgy)
Ohmic contact
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Effect of Si or Al interface layers on the properties of Ta and Mo contacts to p-type SiC
2000
Journal of Electronic Materials
J. O. Olowolafe
J. Liu
R. B. Gregory
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Citations (7)
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