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C. J. D. Hetherington

University of Oxford

41

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1026

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Characterization of a porous silicon carbide layer produced on a 6H-SiC substrate: TEM (XHREM) and EDX studies

2018
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Real-time in-situ Investigation of III-V Nanowire Growth using Custom-designed Hybrid Chemical Vapor Deposition-TEM

2017 Microscopy and Microanalysis
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Enhanced and Stable Field Emission from in Situ Nitrogen-Doped Few-Layered Graphene Nanoflakes

2011 Journal of Physical Chemistry C
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Exploring the fundamental effects of deposition time on the microstructure of graphene nanoflakes by Raman scattering and X-ray diffraction

2011 CrystEngComm
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Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires.

2011 Microscopy and Microanalysis
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Low-dose aberration corrected cryo-electron microscopy of organic specimens

2008 Ultramicroscopy
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Imaging Active Sites on Platinum Catalytic Nanoparticles Using Aberration-Corrected Electron Microscope

2007 Microscopy and Microanalysis
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Cs-Corrected Cryo-Electron Microscopy for Biological Samples

2007 Microscopy and Microanalysis
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Aberration‐Corrected Imaging of Active Sites on Industrial Catalyst Nanoparticles

2007 Angewandte Chemie
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Materials Advances through Aberration- Corrected Electron Microscopy

2006 Mrs Bulletin
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Citations (79)