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H Sahr
H Sahr
Manufacturing engineering
Metrology
Vendor
Engineering
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3
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1
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2024
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Productivity enhancement using a methodical approach to defect reduction based on synergy of process and defect metrology knowledge
2003
ASMC | Advanced Semiconductor Manufacturing Conference
R. Schreutelkamp
M.J. van der Reijden
T. King
K. Mast
I. Englard
J. Zondag
F. Rommel
S. Harzenetter
H. Schoel
J. Cavelaars
M. Swaanen
Liang Shi
H Sahr
M. Gerwig
M Junker
R. Poschadel
B Hein
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Reducing defects methodically through fab/vendor process and metrology collaboration.
2003
MICRO | International Symposium on Microarchitecture
R. Schreutelkamp
van der Reijden M
T. King
K. Mast
J. Zondag
H Sahr
J. Cavelaars
M Swaanen
Shi L
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Dissertation Reviews (Music education)
2001
Richard Weerts
H Sahr
S Hong
G Ritcher
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