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Joyce Lin
Joyce Lin
LSI Corporation
Analytical chemistry
Electronic engineering
CMOS
Nitrogen
MOSFET
4
Papers
8
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Deposition and Characterization of Polycrystalline Si1 − x Ge x Films for CMOS Transistors Gate Electrode Applications
2005
Journal of The Electrochemical Society
Wai Lo
Hong Lin
Wei-jen Hsia
Colin Yates
Verne Hornback
Jim Elmer
Wilbur G. Catabay
Mohammad R. Mirabedini
Venkatesh P. Gopinath
Erhong Li
David Pachura
Joyce Lin
L. Duong
Sharad Prasad
Masanobu Matsunaga
Toshitake Tsuda
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An impedance-phase angle (Z-theta) method for capacitance extraction of ultra-thin gate dielectrics at intermediate frequency [MOS devices]
2004
ICMTS | International Conference on Microelectronic Test Structures
Joyce Lin
Chien-Hwa Chang
Sharad Prasad
William Loh
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Method of increasing gate nitridation and its impact on CMOS devices
2003
Venkatesh P. Gopinath
Verne Hornback
Ynhi Le
Arvind Kamath
L. Duong
Joyce Lin
Mohammad R. Mirabedini
Wen-Chin Yeh
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Effect of nitrogen incorporation on PMOS negative bias temperature instability in ultrathin oxi-nitrides
2003
IIRW | International Integrated Reliability Workshop
L. Duong
Erhong Li
Venkatesh P. Gopinath
Sharad Prasad
Joyce Lin
David Pachura
Verne Hornback
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