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A. Jain
A. Jain
Rutgers University
Fault model
Real-time computing
Very-large-scale integration
Reliability engineering
Computer science
1
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4
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On the evaluation of arbitrary defect coverage of test sets
1999
VTS | VLSI Test Symposium
A. Jain
V. Boppana
Michael S. Hsiao
M. Fujita
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Citations (4)
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