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M. Zaleski
- Freescale Semiconductor
6
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166
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- X. Chen
- Srikanth B. Samavedam
- Vijay Narayanan
- Kenneth J. Stein
- C. Hobbs
- Christopher V. Baiocco
- Weipeng Li
- D. Jaeger
- M. Zaleski
- Haining Yang
- N.S. Kim
- Yong Meng Lee
- Da Zhang
- Laegu Kang
- J. Chen
- Haoren Zhuang
- Arifuzzaman (Arif) Sheikh
- J. Wallner
- Michael V. Aquilino
- J.-P. Han
- Zhenrong Jin
- Junjun Li
- G. Massey
- S. Kalpat
- Rashmi Jha
- Naim Moumen
- R. Mo
- S. Kirshnan
- X. Wang
- Michael P. Chudzik
- Murshed M. Chowdhury
- Deleep R. Nair
- C. Reddy
- Young Way Teh
- Chandrasekharan Kothandaraman
- Douglas D. Coolbaugh
- S. Pandey
- D. Tekleab
- Aaron Thean
- M. Sherony
- Craig S. Lage
- J. Sudijono
- R. Lindsay
- J.-H. Ku
- M. Khare
- A. Steegen
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Citations (80) - Manufacturability and Speed Performance Demonstration of Porous ULK (k=2.5) for a 45nm CMOS PlatformShow All
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Citations (3) -
- E. Josse
- S. Parihar
- O. Callen
- Paulo Ferreira
- C. Monget
- A. Farcy
- M. Zaleski
- D. Villanueva
- R. Ranica
- M. Bidaud
- D. Barge
- C. Laviron
- N. Auriac
- C. Le Cam
- S. Harrison
- Scott Warrick
- F. Leverd
- P. Gouraud
- S. Zoll
- F. Guyader
- E. Perrin
- E. Baylac
- Jerome Belledent
- B. Icard
- Blandine Minghetti
- Serdar Manakli
- Laurent Pain
- V. Huard
- G. Ribes
- K. Rochereau
- S. Bordez
- C. Blanc
- A. Margain
- D. Delille
- R. Pantel
- K. Barla
- N. Cave
- M. Haond
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Citations (29) -
- R. Fox
- O. Hinsinger
- E. Richard
- E. Sabouret
- T. Berger
- C. Goldberg
- A. Humbert
- G. Imbert
- P. Brun
- E. Ollier
- C. Maurice
- M. Guillermet
- C. Monget
- V. Plantier
- H. Bono
- M. Zaleski
- M. Mellier
- J.-P. Jacquemin
- John C. Flake
- B G Sharma
- Lucile Broussous
- A. Farcy
- V. Arnal
- Roberto Gonella
- S. Maubert
- V. Girault
- P. Vannier
- D. Reber
- A. Schüssler
- J. Mueller
- W.F.A. Besling
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Citations (10)
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