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M. Taib-Azar
M. Taib-Azar
Very-large-scale integration
Boundary scan
CMOS
Power Fluctuation
Electronic engineering
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Improving bus test via I/sub DDT/ and boundary scan
2001
DAC | Design Automation Conference
Shih-Yu Yang
C.A. Papachristou
M. Taib-Azar
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