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L. J. Brillson

Ohio State University
Xerox
Philips

401

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Nanoscale 3-dimensional characterization of wide bandgap power and microdevices

2019 The Japan Society of Applied Physics
- L. J. Brillson
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Probing the Nanoscale Interplay of Native Defects and Doping in Oxide Semiconductors

2019 Bulletin of the American Physical Society
- L. J. Brillson
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Defect Characterization, Imaging, and Control in Wide-Bandgap Semiconductors and Devices

2018 Journal of Electronic Materials
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Single Metal Ohmic and Rectifying Contacts to ZnO Nanowires: A Defect Based Approach

2018 Annalen der Physik
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Defect Manipulation To Control ZnO Micro-/Nanowire-Metal Contacts

2018 Nano Letters
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Bandgap and band edge positions in compositionally graded ZnCdO

2018 Journal of Applied Physics
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Optical signatures of deep level defects in Ga2O3

2018 Applied Physics Letters
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Direct observation of a two-dimensional hole gas at oxide interfaces

2018 Nature Materials
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Identification of Ge vacancies as electronic defects in methyl- and hydrogen-terminated germanane

2018 Applied Physics Letters
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Identification of a functional point defect in SrTi O 3

2018 Physical Review Materials
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