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Christopher Otte
Christopher Otte
Ludwig Maximilian University of Munich
Electronic engineering
test structure
Megabit
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Analytical chemistry
2
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6
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A 1 Mbit SRAM test structure to analyze local mismatch beyond 5 sigma variation
2007
ICMTS | International Conference on Microelectronic Test Structures
Thomas Fischer
Christopher Otte
Doris Schmitt-Landsiedel
Ettore Amirante
Alexander Olbrich
Peter Huber
Martin Ostermayr
Thomas Nirschl
Jan Einfeld
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Citations (6)
A 1MbitSRAM test structure toanalyze local mismatch beyond5sigmavariation
2007
International Conference on Microelectronic Test Structures
Christopher Otte
Ettore Amirante
Alexander Olbrich
Peter Huber
Doris Schmitt-Landsiedel
Martin Ostermayr
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