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Kan Yuan Lee
Kan Yuan Lee
VLSI Technology
Oxide
Thin-film transistor
Analytical chemistry
Gate oxide
Plasma processing
3
Papers
5
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Impact of Hydrogenating Plasma Induced Oxide Charging Effects on the Characteristics of Polysilicon Thin Film Transistors
1997
Japanese Journal of Applied Physics
Kan Yuan Lee
Yean-Kuen Fang
Chii Wen Cheng
Kou-Chin Huang
Mong-Song Liang
Sou Gow Wuu
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The Impacts of Back-End High Temperature Thermal Treatments on the Characteristics and Gate Oxide Reliability of Thin Film Transistor in Ultra Large Scale Integrated Circuit Process
1997
Japanese Journal of Applied Physics
Kan Yuan Lee
Yean-Kuen Fang
Chii Wen Chen
Dung Niang Yaung
Kuen Hsien Wuu
Jyh-jier Ho
Mong-Song Liang
Shou Gwo Wuu
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