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Bilal Elkassir

NXP Semiconductors

5

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18

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Design and analysis of integrated Built-in-Sensors for wireless reconfigurable applications

2012 EMICC | European Microwave Integrated Circuit Conference
- Bilal Elkassir
- Sidina Wane
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Built-In-Self-Test (BIST) probing for wireless non-contact measurement and characterization of integrated circuits and systems

2011 URSI GASS | URSI General Assembly and Scientific Symposium
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Multi-physics modeling of electro-mechanical oscillators: Comparative analysis of Colpitts and Cross-Coupled architectures

2010 EuMC | European Microwave Conference
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Citations (5)