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Ann-Katrin Thamm
Ann-Katrin Thamm
ETH Zurich
Materials science
Clamping
Membrane
Optoelectronics
Scanning Force Microscope
2
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12
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0
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2024
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Membrane-based scanning force microscopy
2021
Physical review applied
David Hälg
Thomas Gisler
Yeghishe Tsaturyan
Letizia Catalini
Urs Grob
Marc-Dominik Krass
Martin Héritier
Hinrich Mattiat
Ann-Katrin Thamm
Romana Schirhagl
Eric C. Langman
Albert Schliesser
Christian L. Degen
Alexander Eichler
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Citations (12)
Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer
2021
IVNC | International Vacuum Nanoelectronics Conference
M Bodik
Maksym Hennadiiovych Demydenko
C.G.H. Walker
T. Bähler
Thomas Michlmayr
Ann-Katrin Thamm
Urs Ramsperger
Andrew Pratt
S.P. Tear
M.M. El-Gomati
Danilo Pescia
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