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C. Dhose

6

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184

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Neutron-induced SEU in bulk and SOI SRAMS in terrestrial environment

2004 IRPS | International Reliability Physics Symposium
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Transient response of III-V field-effect transistors to heavy-ion irradiation

2004 IEEE Transactions on Nuclear Science
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Study of transient current induced by heavy-ion in NMOS/SOI transistors

2002 IEEE Transactions on Nuclear Science
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Insights on the transient response of fully and partially depleted SOI technologies under heavy-ion and dose-rate irradiations

2002 IEEE Transactions on Nuclear Science
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