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D. Ruggiero
D. Ruggiero
STMicroelectronics
Analytical chemistry
X-ray photoelectron spectroscopy
Inorganic chemistry
Infrared spectroscopy
Crystalline silicon
2
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26
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Chemical, energetic, and geometric heterogeneity of device-quality (1 0 0) surfaces of single crystalline silicon after HFaq etching’
2008
Applied Surface Science
Gianfranco Cerofolini
A. Giussani
A. Modelli
Danilo Mascolo
D. Ruggiero
Dario Narducci
E. Romano
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Citations (14)
Combined IR and XPS analysis of the native (1 0 0) surface of single-crystalline silicon after HFaq etching
2007
Surface and Interface Analysis
Gianfranco Cerofolini
A. Giussani
F. Carone Fabiani
A. Modelli
Danilo Mascolo
D. Ruggiero
Dario Narducci
E. Romano
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Citations (12)
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