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M. Rivas
M. Rivas
University of Texas at Dallas
Electronic engineering
Engineering
Thin-film transistor
Amorphous solid
Subthreshold conduction
2
Papers
13
Citations
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Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors
2016
Microelectronics Reliability
M. Estrada
M. Rivas
I. Garduno
Fernando Avila Herrera
A. Cerdeira
Marcelo Antonio Pavanello
Israel Mejia
M. A. Quevedo-Lopez
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Citations (13)
Bias stress study of Metal-Insulator-Semiconductor structures with pulsed laser deposited InGaZnO on atomic layer deposited HfO2
2015
ROPEC | IEEE International Autumn Meeting on Power, Electronics and Computing
Salvador Ivan Garduño
M. Estrada
I. Hernandez
A. Cerdeira
J. I. Mejia
M. Rivas
M. A. Quevedo
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