Old Web
English
Sign In
Acemap
>
authorDetail
>
Joerg Mellmann
Joerg Mellmann
Engineering drawing
Wafer
Computer science
Integrated circuit
Process window
1
Papers
1
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Machine learning based wafer defect detection
2019
Yuansheng Ma
Feng Wang
Qian Xie
Le Hong
Joerg Mellmann
Yuyang Sun
Shaowen Gao
Sonal Singh
Panneerselvam Venkatachalam
James Word
Show All
Source
Cite
Save
Citations (1)
1