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Arianna Nardo
Arianna Nardo
University of Padua
Engineering
Trapping
Electronic engineering
Process engineering
Reliability engineering
3
Papers
12
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0
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Storage and release of buffer charge in GaN-on-Si HEMTs investigated by transient measurements
2020
Applied Physics Express
Arianna Nardo
Matteo Meneghini
A. Barbato
Carlo De Santi
Gaudenzio Meneghesso
Enrico Zanoni
Sebastien Sicre
Luca Sayadi
Gerhard Prechtl
Gilberto Curatola
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Citations (6)
Stability and degradation of isolation and surface in Ga2O3 devices
2019
Microelectronics Reliability
C. De Santi
Arianna Nardo
Man Hoi Wong
Ken Goto
Akito Kuramata
Shigenobu Yamakoshi
Hisashi Murakami
Yoshinao Kumagai
Masataka Higashiwaki
Gaudenzio Meneghesso
Enrico Zanoni
Matteo Meneghini
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Citations (2)
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