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D.W. Ackland

Center for Advanced Materials

3

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Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction

2006 Microscopy and Microanalysis
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Practical Estimation of Analytical Sensitivity for EDS in an Intermediate Voltage FEG-STEM

1997 Microscopy and Microanalysis
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The standard hole-count test: A progress report

1991
- C. E. Lyman
- D.W. Ackland
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Citations (1)