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Nicole Nulkes
Nicole Nulkes
Computer vision
Scanning probe microscopy
Proof of concept
Metrology
Artificial intelligence
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Papers
7
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Demonstration of Parallel Scanning Probe Microscope for high throughput metrology and inspection
2015
Proceedings of SPIE
Hamed Sadeghian
Bert Dekker
Rodolf Herfst
J. Winters
Alexander Eigenraam
Ramon Rijnbeek
Nicole Nulkes
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Citations (7)
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