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J. Yanes
J. Yanes
Cork Institute of Technology
Chip formation
Temperature measurement
Electronic engineering
Infrared
Steady state
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Temperature and strain measurement during chip formation in orthogonal cutting conditions applied to Ti-6Al-4V
2013
Procedia Engineering
M. Cotterell
E. Ares
J. Yanes
F. López
P. Hernandez
G. Peláez
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Citations (22)
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