Old Web
English
Sign In
Acemap
>
authorDetail
>
Dong S. Shim
Dong S. Shim
Ellipsometry
Crystallinity
Sputter deposition
Scanning electron microscope
Microstructure
1
Papers
6
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Characterization of polycrystalline AlN films using variable-angle spectroscopic ellipsometry
2005
Journal of Vacuum Science and Technology
Li-Peng Wang
Dong S. Shim
Qing Ma
Valluri Rao
Eyal Ginsburg
Alexander Talalyevsky
Show All
Source
Cite
Save
Citations (6)
1