Old Web
English
Sign In
Acemap
>
authorDetail
>
Ronaldo W. Reis
Ronaldo W. Reis
Nickel
Annealing (metallurgy)
Wafer
X-ray crystallography
Analytical chemistry
4
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
CARACTERIZAÇÃO ELÉTRICA DE CONTATOS RASOS DE SILICETO DE NÍQUEL COM PLATINA SOBRE JUNÇÕES N + P
2008
R. Pestana
Ronaldo W. Reis
S.G. Santos Filho
Show All
Source
Cite
Save
Citations (0)
Formation of nickel silicides onto as-doped silicon using a thin Pt/Pd interlayer
2004
SBMicro | Symposium on Microelectronics Technology and Devices
Ronaldo W. Reis
Sebastiao G. Dos Santos
Ioshiaki Doi
Jacobus W. Swart
Show All
Source
Cite
Save
Citations (0)
Formation of nickel silicides onto (100) silicon wafer surfaces using a thin platinum interlayer
2003
SBMicro | Symposium on Microelectronics Technology and Devices
Ronaldo W. Reis
Sebastiao G. Dos Santos
Ioshiaki Doi
Jacobus W. Swart
Show All
Source
Cite
Save
Citations (0)
Formation of nickel monosilicide onto (100) silicon wafer surfaces
2002
Ronaldo W. Reis
Sebastião G. Dos Santos Filho
Armando Antônio Maria Laganá
Ioshiaki Doi
Jacobus W. Swart
Show All
Source
Cite
Save
Citations (0)
1