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Jeffery B. Bindell
Jeffery B. Bindell
Alcatel-Lucent
Analytical chemistry
Optics
Stylus
Scanning probe microscopy
Scanning Hall probe microscope
4
Papers
20
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Noncontact ultrasonic ULSI process metrology using ultrafast lasers
1998
High-power lasers and applications
Robert J. Stoner
Christopher J. Morath
Guray Tas
Samit S. Sengupta
Sailesh Mansinh Merchant
Jeffery B. Bindell
Humphrey J. Maris
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Approach to CD-SEM metrology utilizing the full waveform signal
1998
John Martin Mcintosh
Brittin C. Kane
Jeffery B. Bindell
C. B. Vartuli
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Citations (12)
Wall angle measurement with a scanning probe microscope employing a one-dimensional force sensor
1997
Journal of Vacuum Science & Technology B
Joseph Edward Griffith
L. C. Hopkins
Charles E. Bryson
Andreas Berghaus
E. J. Snyder
J.J. Plombon
Leonid Vasilyev
M. Hecht
Jeffery B. Bindell
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Citations (2)
Stability of glass probe tips for critical dimension measurement
1997
Joseph Edward Griffith
Gabriel Lorimer Miller
L. C. Hopkins
Charles E. Bryson
E. Snyder
J.J. Plombon
Leonid Vasilyev
Jeffery B. Bindell
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