Old Web
English
Sign In
Acemap
>
authorDetail
>
Do Hyeon Yun
Do Hyeon Yun
Test set
Electronic circuit
Compatibility (mechanics)
Compaction
Fault coverage
2
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Clinical Course of COVID-19 in Asymptomatic and Mildly Symptomatic Patients: Archives of a Living and Treatment Support Center in South Korea (Part I)
2020
Soomin Nam
Yeon-ho Lee
Kye Seon Jang
Mun-Young Chang
Do Hyeon Yun
Hye Seon Park
Jin-Kyu Lee
Hyoung Seop Kim
Show All
Source
Cite
Save
Citations (0)
An Efficient algorithm for test pattern compaction using independent faults and compatible faults
2001
Journal of the Institute of Electronics Engineers of Korea
Do Hyeon Yun
Seong-Ho Gang
Hyeong-Bok Min
Show All
Source
Cite
Save
Citations (0)
1