Old Web
English
Sign In
Acemap
>
authorDetail
>
W. E. Vanderlinde
W. E. Vanderlinde
Electronic engineering
Scanning SQUID microscopy
SQUID
Engineering
Analytical chemistry
4
Papers
56
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Scanning SQUID microscopy for current imaging
2001
Microelectronics Reliability
L. A. Knauss
A. B. Cawthorne
Nesco M. Lettsome
S. Kelly
S. Chatraphorn
Erin Franklin Fleet
F. C. Wellstood
W. E. Vanderlinde
Show All
Source
Cite
Save
Citations (40)
Localizing power to ground shorts in a chips-first MCM by scanning SQUID microscopy
2000
IRPS | International Reliability Physics Symposium
W. E. Vanderlinde
M.E. Cheney
E. B. McDaniel
K. L. Skinner
L.A. Knauss
B.M. Frazier
Hans M. Christen
Show All
Source
Cite
Save
Citations (6)
Fast, Clean and Low Damage Deprocessing Using Inductively Coupled and RIE Plasmas
1996
W. E. Vanderlinde
C. J. von Benken
C.M. Davin
A.R. Crockett
Show All
Source
Cite
Save
Citations (2)
Nondestructive determination of composition depth profiles on subnanometer scales using angle resolved Auger spectroscopy
1992
Journal of Vacuum Science and Technology
G. N. Derry
W. E. Vanderlinde
Show All
Source
Cite
Save
Citations (8)
1