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M. Van Dievel
M. Van Dievel
Design for manufacturability
Electronic engineering
CMOS
Very-large-scale integration
Leakage (electronics)
2
Papers
17
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Elevated source/drain by sacrificial selective epitaxy for high performance deep submicron CMOS: Process window versus complexity
2000
IEEE Transactions on Electron Devices
E. Augendre
Rita Rooyackers
Matty Caymax
Ewout Vandamme
A. De Keersgieter
C. Perelló
M. Van Dievel
S. Pochet
Gonçal Badenes
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Citations (10)
A High Performance 0.18 um Elevated Source/Drain Technology with Improved Manufacturability
1999
ESSDERC | European Solid-State Device Research Conference
E. Augendre
Rita Rooyackers
Ewout Vandamme
C. Perelló
M. Van Dievel
S. Pochet
Gonçal Badenes
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Citations (7)
1