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J. Gaudiello
J. Gaudiello
Materials science
Analytical chemistry
Fin
Crystallography
Strained silicon
3
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Precession Electron Diffraction (PED) Strain Measurements in Stacked Nanosheet Structures
2019
Microscopy and Microanalysis
J. Li
Shogo Mochizuki
Jingyun Zhang
Nicolas Loubet
J. Gaudiello
B. Haran
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Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices
2018
Microscopy and Microanalysis
Junjun Li
Hiroaki Niimi
Oleg Gluschenkov
Praneet Adusumilli
Jody A. Fronheiser
Shogo Mochizuki
Zuoguang Liu
Vimal Kamineni
M. Raymond
Adra V. Carr
Tenko Yamashita
B. Veeraraghavan
N. Saulnier
J. Gaudiello
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Elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations
2015
Microscopy and Microanalysis
Junjun Li
Pierre Morin
Qing Liu
Kangguo Cheng
Nicolas Loubet
Bruce B. Doris
J. Gaudiello
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