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K. Reshöft
K. Reshöft
Ruhr University Bochum
Thin film
Scanning probe microscopy
Microscopy
Electron diffraction
Low-energy electron diffraction
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In-situ analysis of thin film growth using STM
2004
U. Köhler
V. Dorna
C. Jensen
M. Kneppe
G. Piaszenski
K. Reshöft
Claudia C. Wolf
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