author-photo

R.N. Jacobs

6

Papers

14

Citations

Citation Trend

Filter By

Papers (5) Sort By

Journal Conference Others

The Use of Confocal Photoluminescence Microscopy for Determination of Defect Densities in Various 2-6 Semiconductors

2014
Show All
- Source
- Cite
- Save
Citations (0)
High-Quality (211)B CdTe on (211)Si Substrates Using Metalorganic Vapor-Phase Epitaxy

2011 Journal of Electronic Materials
Show All
- Source
- Cite
- Save
Citations (3)
Cyclic Annealing During Metalorganic Vapor-Phase Epitaxial Growth of (211)B CdTe on (211) Si Substrates

2010 Journal of Electronic Materials
Show All
- Source
- Cite
- Save
Citations (6)
MBE Growth and Transfer of HgCdTe Epitaxial Films from InSb Substrates

2010 Journal of Electronic Materials
Show All
- Source
- Cite
- Save
Citations (5)
Analysis of defects in HgCdTe and CdTe epilayers on Si by dual-beam FIB

2006 Microscopy and Microanalysis
Show All
- Source
- Cite
- Save
Citations (0)