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Sheng-Qian Dai
Sheng-Qian Dai
Electronic engineering
Electromigration
Nucleation
Nanowire
Current density
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Anomalous single bit retention induced by asymmetric STI-corner-thinning for floating gate Flash memories
2012
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Ming-Yi Lee
Wei Hao Hsiao
Ru-Ping Chen
Li-Kuang Kuo
Sheng-Qian Dai
Rong-Cyuan Ting
Chih-Lin Chen
Da-Gang Chu
Chih-Yuan Lu
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Reliability assessment and physical failure analysis of nanoscale hard-mask-etching Al interconnect
2012
IRPS | International Reliability Physics Symposium
Ming-Yi Lee
An-Shun Teng
Chia-Hao Tu
Li-Kuang Kuo
Sheng-Qian Dai
Chia-Chien Shine
Te-Chi Yen
Hong-Ji Lee
Chih-Yuan Lu
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