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Donavan Leonard
Donavan Leonard
Atom probe
Optoelectronics
Doping
Common emitter
Wafer
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Quantification of Dopant Profiles in SiGe HBT Devices
2018
Eric J. Jones
Jonathan Poplawsky
Donavan Leonard
Keith Chung
Kevin Mercurio
Paul David Brabant
Thomas N. Adam
Patrick B. Shea
Thomas Knight
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