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A.I. Oleshkevych
A.I. Oleshkevych
Uppsala University
Analytical chemistry
Thin film
Diffusion layer
Bilayer
Auger electron spectroscopy
1
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Enhanced diffusion caused by surface reactions in thin films of Sn-Cu-Mn
2014
Thin Solid Films
A.I. Oleshkevych
S. M. Voloshko
Sergey I. Sidorenko
Gábor A. Langer
Dezső L. Beke
Adrian R. Rennie
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