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Alik Sargsyan
Alik Sargsyan
Artificial intelligence
Pattern recognition
Cluster analysis
Automated optical inspection
Anomaly detection
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1
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Automated Optical Inspection Using Anomaly Detection and Unsupervised Defect Clustering
2020
ETFA | Emerging Technologies and Factory Automation
Jan Lehr
Alik Sargsyan
Martin Pape
Jan Philipps
Jörg Krüger
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