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Jason Doege
Jason Doege
Kennedy Space Center
Electronic engineering
Computer science
Boundary scan
CMOS
System testing
2
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35
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IEEE P1687: Toward Standardized Access of Embedded Instrumentation
2006
ITC | International Test Conference
Ken Posse
Al Crouch
Jeff Rearick
Bill Eklow
Mike Laisne
Ben Bennetts
Jason Doege
Mike Ricchetti
Jean-Francois Cote
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Citations (27)
Improving board and system test: a proposal to integrate boundary scan and I/sub DDQ/
1995
ITC | International Test Conference
Douglas Reed
Jason Doege
Antonio Rubio
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Citations (8)
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