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D. K. Huynh
D. K. Huynh
BiCMOS
Engineering
Network analyzer (electrical)
Silicon-germanium
Frequency response
2
Papers
3
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0
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W-Band Noise Characterization with Back-Gate Effects for Advanced 22nm FDSOI mm-Wave MOSFETs
2020
RFIC | Radio Frequency Integrated Circuits Symposium
Q. H. Le
D. K. Huynh
D. Wang
Zhixing Zhao
S. Lehmann
T. Kämpfe
M. Rudolph
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207-257 GHz Integrated Sensing Readout System with Transducer in a 130-nm SiGe BiCMOS Technology
2019
IMS | International Microwave Symposium
Defu Wang
Jongwon Yun
M. H. Eissa
Maciej Kucharski
Klaus Schmalz
Andrea Malignaggi
Yong Wang
Johannes Borngraber
Y. Liang
Herman Jalli Ng
Q. H. Le
D. K. Huynh
Thomas Kämpfe
K. Seidel
Dietmar Kissinger
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Citations (2)
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