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Guy Levin
Guy Levin
Applied Materials
Metrology
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Computer science
Optics
2
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1
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0
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Accuracy assessment between on-product and on-optical-target overlay metrology with optical microscopy, SEM and STEM (Conference Presentation)
2020
Yaniv Abramovitz
Lior Lior Sarig
Guy Levin
Shimon Levi
Ofer Adan
Laurens Kwakman
Ashley Tilson
Jason Arjavac
Michael Strauss
Philippe Leray
Steven Scheer
Michael Engelmann
Sandip Halder
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Accelerating on-device overlay metrology accuracy verification
2020
Yaniv Abramovitz
Lior Lior Sarig
Guy Levin
Shimon Levi
Ron Davidescu
Daniel Harel
Ofer Adan
Philippe Leray
Sandip Halder
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