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F. Bourouba
F. Bourouba
Electronic engineering
Capacitor
Engineering
Oxide
Dielectric
1
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7
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Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC
2013
Microelectronics Reliability
Z. Ouennoughi
Christian Strenger
F. Bourouba
Volker Haeublein
H. Ryssel
L. Frey
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Citations (7)
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