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Fred Sharifi

National Institute of Standards and Technology

14

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244

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Porous silicon carbide cold electron sources

2019 IVEC | International Vacuum Electronics Conference
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Experimental Evidence for s-Wave Pairing Symmetry in Superconducting Cu_{x}Bi_{2}Se_{3} Single Crystals Using a Scanning Tunneling Microscope | NIST

2013 Physical Review Letters
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An apparatus for concurrent measurement of thermoelectric material parameters

2013 Review of Scientific Instruments
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Scanning Tunneling Microscopy of the Topological Crystalline Insulator SnTe

2013 Bulletin of the American Physical Society
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Scanning Tunneling Microscopy Measurements of Superconductivity in Cu$_{\mathrm{x}}$Bi$_2$Se$_3$

2013 Bulletin of the American Physical Society
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Fabrication and characterization of nanostructured III-V thermoelectric materials

2013 Proceedings of SPIE
- Clint J. Novotny
- Fred Sharifi
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Scanning Tunneling Microscopy Measurements of Superconductivity in Cu x Bi 2 Se 3

2013
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Stable field emission from nanoporous silicon carbide.

2013 Nanotechnology
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Probing for Topological Superconductivity in In-doped SnTe

2013 Bulletin of the American Physical Society
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Field emission from nanoporous silicon carbide

2012 IEEE-NANO | International Conference on Nanotechnology
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